Cascade Microtech was acquired by FormFactor for $352M on Feb 4, 2016 .
Correspondingly, What is a probe card used for? A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI manufacturing. A probe card is docked to a wafer prober to serve as a connector between the LSI chip electrodes and an LSI tester as a measuring machine.
What are probe systems? A probe positioning system is a tool for the positioning of a (hand-held) measuring device, such as an ultrasound transducer in a fixed, predetermined place to the object, such as a patient. The operation of these systems varies from completely manual, to completely automated.
Furthermore, What is a cantilever probe card?
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements.
What is a vertical probe card?
Vertical-Probe refers to probe cards suitable for multi-die testing of general logic products, including SoC and microcomputer products. It is called a “vertical-type” probe card because the probe needles are vertical to the substrate.
What is an analytical probe? Analytical probe systems, also referred to as prober, probing system, probe system, are often used in low volume probing applications such as research and development, device characterization, product development and failure analysis.
What is a probe location? A probe is placed into the oesophagus, either orally or nasally and is similar to placing a nasogastric tube. Easy to use and quick to focus, the device generates a low frequency ultrasound signal which is highly sensitive to changes in flow and measures them immediately.
How do you use a probe station? 
What is a probe needle?
what are probe needles? Probe needles, also known as probe tips or needle probes, are provided in a variety of materials, lengths, shapes and tip radius. They are typically inserted into a single probe arm mounted to a manipulator. Probe needles directly contact the device under test.
How does a wafer prober work? In an electrical test, test signals from a measuring instrument or tester are transmitted to individual devices on a wafer via probe needles or a probe card and the signals are then returned from the device. A wafer prober is used for handling the wafer to make contact in the designated position on the device.
What is a prober?
noun. One who inquires: inquirer, inquisitor, investigator, querier, quester, questioner, researcher.
What is a sample probe? Sample probes are designed for extracting a representative portion from the gas sample source in a pipe to the sampling system, and finally the gas analyzers. Sample gas probes form a critical point between process and sample conditioning and analysis system.
Which is the material used for the probe in ultrasonic test?
Ultrasonic probes or transducers are devices that generate and receive high-frequency ultrasound. An ultrasonic transducer is made up of a piezoelectric material, a backing, and a wear plate. Piezoelectric material converts electrical energy into ultrasound.
What can affect the efficiency of the wafer probe card?
Perhaps the most important factor impacting probe card efficiency is the number of DUTs that can be tested in parallel. Many wafers today are still tested one device at a time.
What is wafer final test? Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them.
What is DC and RF wafer testing? Abstract: An automated wafer level RF/DC test system useful to frequency above 20 GHz has been developed to characterize and determine acceptability of microwave semiconductor die prior to dicing the wafer.
How are semiconductors tested?
Normally, IC testing is conducted at two levels: the wafer test (also called die sort or probe test) that tests wafers, and the package test (also called final test) after packaging. Wafer testing uses a prober and a probe card, while package testing uses a handler and a test socket, together with a tester.
What is a wafer tester? A wafer prober is a machine (Automatic test equipment) used to test integrated circuits. For electrical testing a set of microscopic contacts or probes called a probe card are held in place whilst the wafer, vacuum-mounted on a wafer chuck, is moved into electrical contact.
What is the important role of a wafer probe?
Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged.
How wafers are fabricated? The silicon wafers start out blank and pure. The circuits are built in layers in clean rooms. First, photoresist patterns are photo-masked in micrometer detail onto the wafers’ surface. The wafers are then exposed to short-wave ultraviolet light and the unexposed areas are thus etched away and cleaned.